Dongwon Park, Daeyeal Lee, Ilgweon Kang, Sicun Gao, Bill Lin, Chung-Kuan Cheng
{"title":"SP&R: Simultaneous Placement and Routing framework for standard cell synthesis in sub-7nm","authors":"Dongwon Park, Daeyeal Lee, Ilgweon Kang, Sicun Gao, Bill Lin, Chung-Kuan Cheng","doi":"10.1109/ASP-DAC47756.2020.9045729","DOIUrl":null,"url":null,"abstract":"Standard cell synthesis requires careful engineering approaches to ensure routability across various digital IC designs since physical design (PD) for sub-7nm technology nodes demands holistic efforts to address urgent and nontrivial design challenges. The smaller number of routing tracks and more complex design rules due to the sophisticated multi-patterning technology make place-and-route (P&R) for designing a standard cell extremely hard and time-consuming. Many conventional approaches have been suggested for improving transistor-level P&R and pin accessibility, nonetheless insufficient because of the heuristic/divide-and-conquer manners.In this paper, we propose a novel framework, SP&R, which simultaneously solves P&R for designing standard cell’s layout without deploying any sequential procedures (between place and route steps) by using dynamic pin allocation-based cell synthesis. The proposed SP&R utilizes the Optimization Modulo Theories (OMT), an extension of the Satisfiability modulo theories (SMT), to obtain optimal standard cell layout by virtue of SAT (Boolean Satisfiability)-based fast reasoning ability. We validate that our SP&R framework achieves 10.5% of reduction on average in terms of metal length compared to the sequential approach, through practical standard cell designs targeting sub-7nm technology nodes.","PeriodicalId":125112,"journal":{"name":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASP-DAC47756.2020.9045729","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
Standard cell synthesis requires careful engineering approaches to ensure routability across various digital IC designs since physical design (PD) for sub-7nm technology nodes demands holistic efforts to address urgent and nontrivial design challenges. The smaller number of routing tracks and more complex design rules due to the sophisticated multi-patterning technology make place-and-route (P&R) for designing a standard cell extremely hard and time-consuming. Many conventional approaches have been suggested for improving transistor-level P&R and pin accessibility, nonetheless insufficient because of the heuristic/divide-and-conquer manners.In this paper, we propose a novel framework, SP&R, which simultaneously solves P&R for designing standard cell’s layout without deploying any sequential procedures (between place and route steps) by using dynamic pin allocation-based cell synthesis. The proposed SP&R utilizes the Optimization Modulo Theories (OMT), an extension of the Satisfiability modulo theories (SMT), to obtain optimal standard cell layout by virtue of SAT (Boolean Satisfiability)-based fast reasoning ability. We validate that our SP&R framework achieves 10.5% of reduction on average in terms of metal length compared to the sequential approach, through practical standard cell designs targeting sub-7nm technology nodes.