Scalable Analytical Model of 1.7 THz Cut-off Frequency Schottky Diodes Integrated in 55nm BiCMOS Technology

Abstract

In this paper, an innovative Schottky diode architecture is proposed and implemented in 55 nm BiCMOS technology. A State-of-the-art 1.7 THz cut-off frequency is measured and an analytical scalable model is proposed and experimentally validated paving the way for further performance improvement. In addition, this analytical model can be integrated in a Design Kit library in order to enable sub-THz Schottky diode-based circuit designs in advanced BiCMOS.