Design and Characterization of ADM-based Dual-band SIW Bandpass Filter

Abstract

This paper deals with the design and characterization of dual-band substrate integrated waveguide (SIW) bandpass filter (BPF) developed based on artificial dielectric material (ADM). The SIW structure is implemented using dielectric substrates flanked by metal layers on the top and bottom sides whereby these metal layers are connected by array of conductor wires called as vias which resemble sidewalls of a waveguide. While the ADM structure is composed of a dielectric substrate incorporated by array of conductor wires in a specific configuration. Both SIW and ADM structures are designed and developed using an FR4 Epoxy dielectric substrate with the relative permittivity of 4.4. Parametric studies are applied upon both structures to obtain an optimum performance of the filter. The characterization result shows that the dual-band SIW BPF configured by a two-stage ADM in face-centered orthorhombic configuration could achieve the bandwidth responses of 150 MHz and 215 MHz with the center frequencies of 1.55 GHz and 2.375 GHz, respectively.