Technology considerations for automotive

H. Casier, P. Moens, K. Appeltans
{"title":"Technology considerations for automotive","authors":"H. Casier, P. Moens, K. Appeltans","doi":"10.1109/ESSDER.2004.1356480","DOIUrl":null,"url":null,"abstract":"In this paper, the evolution of automotive electronics and the specific electronics requirements posed by the automotive environment are discussed. Safety is a very dominant factor in automotive applications and this has a large impact on the required robustness of the electronics. As an example, DMOS optimization and ESD robustness considerations have led to the N-epi based structure of the AMIS I3T automotive technology. On top of the robust technology, innovative design techniques are described which further improve the robustness of the high voltage smart power applications for the harsh environment of the automotive electronics.","PeriodicalId":287103,"journal":{"name":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDER.2004.1356480","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25

Abstract

In this paper, the evolution of automotive electronics and the specific electronics requirements posed by the automotive environment are discussed. Safety is a very dominant factor in automotive applications and this has a large impact on the required robustness of the electronics. As an example, DMOS optimization and ESD robustness considerations have led to the N-epi based structure of the AMIS I3T automotive technology. On top of the robust technology, innovative design techniques are described which further improve the robustness of the high voltage smart power applications for the harsh environment of the automotive electronics.
汽车的技术考虑
本文讨论了汽车电子技术的发展和汽车环境对电子技术的具体要求。在汽车应用中,安全性是一个非常重要的因素,这对电子设备的稳健性有很大的影响。例如,DMOS优化和ESD稳健性考虑导致了AMIS I3T汽车技术基于N-epi的结构。在稳健的技术之上,描述了创新的设计技术,进一步提高了汽车电子恶劣环境下高压智能电源应用的稳健性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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