Embedded DRAM technology: past, present and future

H. Takato, H. Koike, T. Yoshida, H. Ishiuchi
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引用次数: 4

Abstract

Issues and development trends with regard to embedded DRAM are reviewed with real implementations for 0.5 /spl mu/m, 0.35 /spl mu/m and 0.25 /spl mu/m generations. Future directions of the embedded DRAM technologies, including MOSFET structure, memory cells, process cost and performance, are also discussed.
嵌入式DRAM技术:过去、现在和未来
本文回顾了有关嵌入式DRAM的问题和发展趋势,并对0.5 /spl mu/m, 0.35 /spl mu/m和0.25 /spl mu/m代的实际实现进行了回顾。并讨论了嵌入式DRAM技术的未来发展方向,包括MOSFET结构、存储单元、工艺成本和性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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