{"title":"Embedded DRAM technology: past, present and future","authors":"H. Takato, H. Koike, T. Yoshida, H. Ishiuchi","doi":"10.1109/VTSA.1999.786044","DOIUrl":null,"url":null,"abstract":"Issues and development trends with regard to embedded DRAM are reviewed with real implementations for 0.5 /spl mu/m, 0.35 /spl mu/m and 0.25 /spl mu/m generations. Future directions of the embedded DRAM technologies, including MOSFET structure, memory cells, process cost and performance, are also discussed.","PeriodicalId":237214,"journal":{"name":"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers. (Cat. No.99TH8453)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTSA.1999.786044","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Issues and development trends with regard to embedded DRAM are reviewed with real implementations for 0.5 /spl mu/m, 0.35 /spl mu/m and 0.25 /spl mu/m generations. Future directions of the embedded DRAM technologies, including MOSFET structure, memory cells, process cost and performance, are also discussed.