Phase-locked loop simulations using the latency insertion method

J. Schutt-Ainé, P. Goh
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引用次数: 4

Abstract

In this paper we present a novel and simple behavioral model based simulation method for PLLs. We also demonstrate the use of LIM for simulating PLLs. The methods exploit the latency in the PLL formulation and utilize a leapfrog time-stepping discretization scheme to solve for the transient response of the PLL. Various PLL dynamic responses such as lock-in, pull-in and pull-out conditions are simulated and comparisons with analytical solutions are depicted when available. Due to the formulation in the voltage-phase domain, the method does not suffer from the dual time scale problem which is a main issue in full transistor level simulations of PLLs.
使用延迟插入法进行锁相环仿真
本文提出了一种新颖、简单的基于行为模型的锁相环仿真方法。我们还演示了使用LIM来模拟锁相环。该方法利用锁相环公式中的延迟,并利用跨跃时间步进离散化方案来求解锁相环的瞬态响应。各种锁相环动态响应,如锁相、拉相和拉相条件进行了模拟,并在可用的情况下与解析解进行了比较。由于该方法是在电压-相位域进行的,因此该方法不存在双时间尺度问题,而双时间尺度问题是锁相环全晶体管级模拟中的一个主要问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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