Fractal analysis of 3D simulated tree patterns considering critical field and potential drop

Abstract

In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and /spl eta/ (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations.