In Depth Analysis of Driving Loss and Driving Power Supply Structure for SiC MOSFETs

Xuning Zhang, G. Sheh, I. Ji, Sujit Banerjee
{"title":"In Depth Analysis of Driving Loss and Driving Power Supply Structure for SiC MOSFETs","authors":"Xuning Zhang, G. Sheh, I. Ji, Sujit Banerjee","doi":"10.1109/APEC.2019.8722272","DOIUrl":null,"url":null,"abstract":"This paper presents an in-depth analysis of the driving loss for SiC MOSFETs in real applications to help designer determined the power rating of proper gate driving power supplies and select proper gate resistors with enough power rating. A detailed loss estimation method is provided based on the datasheet information. Results verifies that the total driving loss power is determined by driving voltage, device total gate charge and switching frequency. The driving loss distribution analysis with the consideration of the nonlinearity of device gate capacitance is presented which indicates that the loss on turn on and turn off resistors is different, and the loss distribution is related with device working conditions. The power supply implementation for negative voltage driving is also discussed. If two separate voltage sources provide the driving power, each of them must provide real power to drive device gate. If only one voltage source provides the total driving power, a voltage divider circuit or voltage regulate circuit is needed only to provide voltage reference, there is no current through the divider or regulator. No real power is needed from the divider or regulator circuit. Experimental test results are provided to verify all the analysis.","PeriodicalId":142409,"journal":{"name":"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.2019.8722272","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

This paper presents an in-depth analysis of the driving loss for SiC MOSFETs in real applications to help designer determined the power rating of proper gate driving power supplies and select proper gate resistors with enough power rating. A detailed loss estimation method is provided based on the datasheet information. Results verifies that the total driving loss power is determined by driving voltage, device total gate charge and switching frequency. The driving loss distribution analysis with the consideration of the nonlinearity of device gate capacitance is presented which indicates that the loss on turn on and turn off resistors is different, and the loss distribution is related with device working conditions. The power supply implementation for negative voltage driving is also discussed. If two separate voltage sources provide the driving power, each of them must provide real power to drive device gate. If only one voltage source provides the total driving power, a voltage divider circuit or voltage regulate circuit is needed only to provide voltage reference, there is no current through the divider or regulator. No real power is needed from the divider or regulator circuit. Experimental test results are provided to verify all the analysis.
SiC mosfet驱动损耗及驱动电源结构的深入分析
本文对实际应用中SiC mosfet的驱动损耗进行了深入分析,以帮助设计者确定合适的栅极驱动电源的额定功率,并选择合适的具有足够额定功率的栅极电阻。给出了一种基于数据表信息的详细损耗估计方法。结果表明,总驱动损耗功率由驱动电压、器件总栅极电荷和开关频率决定。考虑器件栅极电容非线性的驱动损耗分布分析表明,导通电阻和关断电阻的损耗是不同的,损耗分布与器件工作条件有关。讨论了负电压驱动电源的实现方法。如果两个独立的电压源提供驱动电源,则每个电压源都必须提供驱动器件栅极的实功率。如果只有一个电压源提供总驱动功率,则只需要分压器电路或稳压电路来提供参考电压,没有电流通过分压器或稳压器。不需要来自分压器或稳压器电路的实际功率。实验测试结果验证了所有的分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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