A 1.8 V 2.5 GHz PLL using 0.18 /spl mu/m SOI/CMOS technology

K. Yoshimura, K. Ueda, T. Nakura, K. Kubo, K. Mashiko, S. Maeda, S. Maegawa, Y. Yamaguchi, Y. Matsuda
{"title":"A 1.8 V 2.5 GHz PLL using 0.18 /spl mu/m SOI/CMOS technology","authors":"K. Yoshimura, K. Ueda, T. Nakura, K. Kubo, K. Mashiko, S. Maeda, S. Maegawa, Y. Yamaguchi, Y. Matsuda","doi":"10.1109/SOI.1999.819834","DOIUrl":null,"url":null,"abstract":"Summary form only given. This paper shows a 2.5 GHz PLL circuit for high-speed communication devices using a 0.18 /spl mu/m SOI/CMOS technology. The technology uses a shallow trench structure to effectively isolate active devices on a thin film SOI substrate. We employed floating-body SOI/CMOS in this chip. We applied a ring oscillator for the voltage controlled-oscillator (VCO). The well-known issues of SOI do not affect the circuit stability and noise performance of our PLL circuit for several reasons. Firstly, as the frequency range required for the VCO is comparatively narrow, the floating-body configuration would have little effect on circuit operation (Ueda et al., 1996). Secondly, thermal equilibrium on the ring oscillator can be achieved within a few microseconds (Tenbroek et al., 1998). Then the self-heating issue would be insignificant for the lock-in process of the PLL. Besides this, the buried oxide of SOI and shallow trench isolation reduces the crosstalk noise from the large digital logic block which is the most potentially serious problem for system-level integration of sensitive circuits and large logic blocks.","PeriodicalId":117832,"journal":{"name":"1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1999-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOI.1999.819834","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Summary form only given. This paper shows a 2.5 GHz PLL circuit for high-speed communication devices using a 0.18 /spl mu/m SOI/CMOS technology. The technology uses a shallow trench structure to effectively isolate active devices on a thin film SOI substrate. We employed floating-body SOI/CMOS in this chip. We applied a ring oscillator for the voltage controlled-oscillator (VCO). The well-known issues of SOI do not affect the circuit stability and noise performance of our PLL circuit for several reasons. Firstly, as the frequency range required for the VCO is comparatively narrow, the floating-body configuration would have little effect on circuit operation (Ueda et al., 1996). Secondly, thermal equilibrium on the ring oscillator can be achieved within a few microseconds (Tenbroek et al., 1998). Then the self-heating issue would be insignificant for the lock-in process of the PLL. Besides this, the buried oxide of SOI and shallow trench isolation reduces the crosstalk noise from the large digital logic block which is the most potentially serious problem for system-level integration of sensitive circuits and large logic blocks.
采用0.18 /spl mu/m SOI/CMOS技术的1.8 V 2.5 GHz锁相环
只提供摘要形式。本文介绍了一种采用0.18 /spl mu/m SOI/CMOS技术的高速通信器件的2.5 GHz锁相环电路。该技术使用浅沟槽结构有效地隔离薄膜SOI衬底上的有源器件。我们在芯片中采用了浮体SOI/CMOS。我们采用环形振荡器作为压控振荡器(VCO)。众所周知的SOI问题不会影响我们的锁相环电路的稳定性和噪声性能,原因有几个。首先,由于VCO所需的频率范围比较窄,因此浮体结构对电路运行的影响不大(Ueda et al., 1996)。其次,环形振荡器上的热平衡可以在几微秒内实现(Tenbroek et al., 1998)。那么自热问题对于锁相环的锁相过程将是微不足道的。此外,SOI的埋藏氧化物和浅沟槽隔离降低了大型数字逻辑块的串扰噪声,这是敏感电路和大型逻辑块的系统级集成中最潜在的严重问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信