Evolution of the 1600 V, 20 A, SiC Bipolar Junction Transistors

A. Agarwal, S. Krishnaswami, J. Richmond, C. Capell, S. Ryu, J. Palmour, S. Balachandran, T. Chow, S. Bayne, B. Geil, C. Scozzie, K. Jones
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引用次数: 22

Abstract

SiC power BJTs have been developed over the last five years into a sufficiently mature technology (1-5). The reliability and applications of these devices are now being studied. This paper summarizes the evolution of this development culminating into the most recent performance of the 1600 V, 20 A devices with a current gain of 40 in the linear region, a forced current gain of 27 in the saturation region and a specific on-resistance of 4.5 mohm-cm 2 .
1600v, 20a, SiC双极结晶体管的发展
SiC功率bjt在过去五年中已经发展成为一种足够成熟的技术(1-5)。目前正在研究这些装置的可靠性和应用。本文总结了这一发展的演变,最终形成了1600 V, 20 A器件的最新性能,其线性区电流增益为40,饱和区强制电流增益为27,比导通电阻为4.5 mohm- cm2。
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