J. Tan, J. H. Lim, J. Kwon, V. B. Naik, N. Raghavan, K. Pey
{"title":"Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation","authors":"J. Tan, J. H. Lim, J. Kwon, V. B. Naik, N. Raghavan, K. Pey","doi":"10.1109/IRPS48203.2023.10118343","DOIUrl":null,"url":null,"abstract":"Spin-transfer-torque magnetic random-access memory (STT-MRAM) is a proven technology for embedded non-volatile memory applications. The backhopping phenomena in STT-MRAM, whereby the resistance of the device oscillates under higher current, has been recently explored for emerging spiking neural network applications. We report a detailed characterization of backhopping in foundry compatible STT-MRAM having ~15kb bit-cell arrays by analyzing the behavior of backhopping spike rate versus applied current and temperature. Our study shows that the backhopping in STT-MRAM exhibits the Poisson statistics with a controllable spike rate with current that displays three regimes: non-backhopping, exponential and linear. This mimics the behavior of a rectified linear unit (ReLU) neuron, a commonly used activation function in deep learning models. A spiking neural network (SNN) communication channel is simulated using the derived statistics and a first principles mathematical framework to analyze the reliability performance of backhopping-based SNN in terms of trading-off the accuracy and applied current.","PeriodicalId":159030,"journal":{"name":"2023 IEEE International Reliability Physics Symposium (IRPS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS48203.2023.10118343","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Spin-transfer-torque magnetic random-access memory (STT-MRAM) is a proven technology for embedded non-volatile memory applications. The backhopping phenomena in STT-MRAM, whereby the resistance of the device oscillates under higher current, has been recently explored for emerging spiking neural network applications. We report a detailed characterization of backhopping in foundry compatible STT-MRAM having ~15kb bit-cell arrays by analyzing the behavior of backhopping spike rate versus applied current and temperature. Our study shows that the backhopping in STT-MRAM exhibits the Poisson statistics with a controllable spike rate with current that displays three regimes: non-backhopping, exponential and linear. This mimics the behavior of a rectified linear unit (ReLU) neuron, a commonly used activation function in deep learning models. A spiking neural network (SNN) communication channel is simulated using the derived statistics and a first principles mathematical framework to analyze the reliability performance of backhopping-based SNN in terms of trading-off the accuracy and applied current.