Modeling indices of reliability for ramified embedded systems

2008 International Conference on Perspective Technologies and Methods in MEMS Design Pub Date : 2008-05-21 DOI:10.1109/MEMSTECH.2008.4558742

A. Sydor

引用次数: 1

Abstract

A method of investigation of reliability indices for ramified systems by means of generating functions is developed taking account of aging of the system's output elements. Main reliability indices of ramified embedded systems are examined in this paper.

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分支嵌入式系统可靠性建模指标

考虑系统输出元件的老化，提出了用生成函数法求解分支系统可靠性指标的方法。本文对分支嵌入式系统的主要可靠性指标进行了研究。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2008 International Conference on Perspective Technologies and Methods in MEMS Design

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