{"title":"Rapid Optoelectronic Characterization of Semiconductors by Combining Bayesian Inference with Metropolis Sampling","authors":"Calvin Fai, C. Hages, Anthony J.C. Ladd","doi":"10.1103/prxenergy.2.033013","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":311086,"journal":{"name":"PRX Energy","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"PRX Energy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1103/prxenergy.2.033013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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