{"title":"Advantage of higher order crack tip fields to singular fields for physical weak-discontinuous crack of FGMs plates","authors":"Chong Xiao, D. Yao","doi":"10.1109/WARTIA.2014.6976198","DOIUrl":null,"url":null,"abstract":"The physical weak-discontinuous problem of an interfacial crack between homogeneous materials and functionally graded materials (FGMs) is studied based on Reissner's plates considering transverse shear deformation effect. The higher order crack tip fields of homogeneous materials and FGMs regions are obtained by the eigen-expansion method. The normalized stress intensity factors(SIFs) and stress distributions near the crack tip are computed and compared by means of the higher order fields and singular fields, respectively.","PeriodicalId":288854,"journal":{"name":"2014 IEEE Workshop on Advanced Research and Technology in Industry Applications (WARTIA)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Workshop on Advanced Research and Technology in Industry Applications (WARTIA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WARTIA.2014.6976198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The physical weak-discontinuous problem of an interfacial crack between homogeneous materials and functionally graded materials (FGMs) is studied based on Reissner's plates considering transverse shear deformation effect. The higher order crack tip fields of homogeneous materials and FGMs regions are obtained by the eigen-expansion method. The normalized stress intensity factors(SIFs) and stress distributions near the crack tip are computed and compared by means of the higher order fields and singular fields, respectively.