Power MOSFETs hardened for single event effects (SEE) in space

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems Pub Date : 1995-09-18 DOI:10.1109/RADECS.1995.509786

D. Carley, C. Wheatley, J. Titus, D. I. Burton

引用次数: 11

Abstract

Measurements are presented for the single event effects and total dose responses of the newly introduced Harris "FS" series of space hardened power MOSFETs. The hardness appears to offer a breakthrough for commercial space requirements.

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功率mosfet在空间中加强了单事件效应(SEE)

介绍了Harris“FS”系列空间硬化功率mosfet的单事件效应和总剂量响应的测量结果。这种硬度似乎为商业空间需求提供了一个突破。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems

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