Process Specific Functions for Assurance of Analog/Mixed-Signal Integrated Circuits

Abstract

This paper investigates the process-induced variation response of analog and mixed-signal ICs to yield anti-counterfeiting and anti-cloning design techniques. It defines unique behaviors called Process Specific Functions (PSFs) that identify circuits of the same pedigree and provide traits for authentication and individual chip identification. To demonstrate PSF utility, expansion of quantization sampling theory is used to produce a statistically bounded digital to analog converter uniqueness model. A parameter space of normalized, challenge driven, non-linear harmonic amplitude responses are then correlated to random and systematic process variations to produce distributions for probability of detection and probability of false alarm statistics. These authenticity characteristics are related to process models to provide a novel analog IC supply chain risk management technology.