Comparison between SRAM SEE cross-sections from ion beam testing with those obtained using a new picosecond pulsed laser facility

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI:10.1109/RADECS.1999.858565

R. Jones, A. Chugg, C. Jones, P. H. Duncan, Chris Dyer, C. Sanderson

引用次数: 39

Abstract

A new pulsed laser facility has been developed to extend laser testing techniques to generate upset cross-section curves. The objective has been to establish an economical laser-based bulk screening capability for SEE susceptibility.

查看原文本刊更多论文

离子束测试的SRAM SEE横截面与使用新的皮秒脉冲激光设备获得的横截面的比较

研制了一种新型脉冲激光设备，将激光检测技术扩展到产生弯曲截面曲线。目标是建立一种经济的基于激光的SEE敏感性整体筛选能力。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

自引率

0.00%

发文量