D. Nozadze, Amendra Koul, Kartheek Nalla, Mike Sapozhnikov, V. Khilkevich
{"title":"Effect of time delay skew on differential insertion loss in weak and strong coupled PCB traces","authors":"D. Nozadze, Amendra Koul, Kartheek Nalla, Mike Sapozhnikov, V. Khilkevich","doi":"10.1109/EPEPS.2017.8329757","DOIUrl":null,"url":null,"abstract":"In this paper, effect of time delay skew (TDS) on differential insertion loss (IL) is studied in both weak and strong forward coupling cases. It is showed that TDS impacts differential IL and impact depends on amount of forward coupling. To predict additional differential IL due to TDS, analytical formula is derived and heuristic formula is constructed based on fitting to simulation results in weak and strong forward coupling cases, respectively. The predictions are validated by simulations and measurements.","PeriodicalId":397179,"journal":{"name":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2017.8329757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, effect of time delay skew (TDS) on differential insertion loss (IL) is studied in both weak and strong forward coupling cases. It is showed that TDS impacts differential IL and impact depends on amount of forward coupling. To predict additional differential IL due to TDS, analytical formula is derived and heuristic formula is constructed based on fitting to simulation results in weak and strong forward coupling cases, respectively. The predictions are validated by simulations and measurements.