Uk-Rae Cho, Tae-Hyoung Kim, Yong-Jin Yoon, Jong-Cheol Lee, Dae-Gi Bae, Nam-Seog Kim, Kang-Young Kim, Young-Jae Son, Jeonghyu Yang, Kwon-Il Sohn, Sung-Tae Kim, I. Lee, Kwang-Jin Lee, Tae-Gyoung Kang, Su-Chul Kim, Kee-Sik Ahn, H. Byun
{"title":"A 1.2 V 1.5 Gb/s 72 Mb DDR3 SRAM","authors":"Uk-Rae Cho, Tae-Hyoung Kim, Yong-Jin Yoon, Jong-Cheol Lee, Dae-Gi Bae, Nam-Seog Kim, Kang-Young Kim, Young-Jae Son, Jeonghyu Yang, Kwon-Il Sohn, Sung-Tae Kim, I. Lee, Kwang-Jin Lee, Tae-Gyoung Kang, Su-Chul Kim, Kee-Sik Ahn, H. Byun","doi":"10.1109/JSSC.2003.818137","DOIUrl":null,"url":null,"abstract":"A 1.2 V 72 Mb DDR3 SRAM in a 0.10 /spl mu/m CMOS process achieves a data rate of 1.5 Gb/s using dynamic self-resetting circuits. Single-ended main data lines reduce the power dissipation and the number of data lines by half. Clocks phase-shifted by 0/spl deg/, 90/spl deg/ and 270/spl deg/ are generated by clock adjustment circuits. On-chip input termination with linearity of /spl plusmn/4.1% is developed to improve signal integrity at higher data rates.","PeriodicalId":171288,"journal":{"name":"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/JSSC.2003.818137","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
A 1.2 V 72 Mb DDR3 SRAM in a 0.10 /spl mu/m CMOS process achieves a data rate of 1.5 Gb/s using dynamic self-resetting circuits. Single-ended main data lines reduce the power dissipation and the number of data lines by half. Clocks phase-shifted by 0/spl deg/, 90/spl deg/ and 270/spl deg/ are generated by clock adjustment circuits. On-chip input termination with linearity of /spl plusmn/4.1% is developed to improve signal integrity at higher data rates.