ReverseAge: An online NBTI combating technique using time borrowing

Seyab Khan, S. Hamdioui
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引用次数: 3

Abstract

As semiconductor manufacturing has entered into the nanoscale era, Negative Bias Temperature Instability (NBTI) has become one of the most significant aging mechanisms leading to reliability issues. This paper presents ReverseAge, a technique that detects delay due to NBTI and utilizes design timing margins to ensure reliable circuit operation. First, it presents a scheme to detect the NBTI induced delay. Second, it presents a technique to tolerate the errors; the technique exploits the available design timing margins to compensate for the NBTI induced delay. The evaluation of ReverseAge has been performed by integrating it in an ISCAS-89 benchmark circuit. The simulation results show 3× reliability improvements with respect to state-of-the-art. The improvement comes at the cost of 3.77% area and 1.4% power overheads.
ReverseAge:一种利用时间借用的在线NBTI对抗技术
随着半导体制造进入纳米时代,负偏置温度不稳定性(NBTI)已成为导致可靠性问题的最重要老化机制之一。本文介绍了ReverseAge,一种检测由于NBTI引起的延迟的技术,并利用设计时间余量来确保可靠的电路运行。首先,提出了一种检测NBTI诱导延迟的方案。其次,它提出了一种容忍错误的技术;该技术利用可用的设计时间余量来补偿NBTI引起的延迟。通过在ISCAS-89基准电路中集成对ReverseAge进行了评估。仿真结果表明,该系统的可靠性比现有系统提高了3倍。改进的代价是3.77%的面积和1.4%的功耗开销。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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