ATE Test Solution for High Resolution and High Voltage DAC

Abstract

High resolution DAC production test is always a difficult problem in mixed signal testing. However, high resolution and high voltage DAC testing is more difficult. Many factors need to be considered in the test of high resolution and high voltage DAC, including the spec of the measurement instrument, the feasibility of the test plan, the actual production efficiency. This paper proposes an ATE test solution for a 32-channel, 14Bit DAC with full-scale output voltage 65V. The hardware solution is based on AVI64 card of 93K platform, which can achieve the measurement resolution of 0.2mV when the measurement range is -40V-80V. The digitizer feature of AVI64 enables direct sampling of chip output waves at sampling rates up to 1MHz. Meanwhile, 4 site parallel test is realized combined with relay switch on load board. The software solution is to design a framework based on the idea of high cohesion and low coupling, which include register configuration based on SPI protocol, IP test realization and common function. Finally, the mass production test of this high resolution and high voltage DAC was realized based on this solution, the result shows that INL is 4 LSB and DNL is 2.5 LSB, which is well correlated with EVB result in lab.