F. Hickernell, H.D. Knuth, R.C. Dablemont, T. Hickernell
{"title":"The surface acoustic wave propagation characteristics of 41/spl deg/ lithium niobate with thin-film SiO/sub 2/","authors":"F. Hickernell, H.D. Knuth, R.C. Dablemont, T. Hickernell","doi":"10.1109/FREQ.1996.559846","DOIUrl":null,"url":null,"abstract":"The surface acoustic wave (SAW) propagation properties of 41/spl deg/ Y-X lithium niobate (LiNbO/sub 3/) with SiO/sub 2/ film layers have been investigated using interdigital transducer structures. Different thicknesses of SiO/sub 2/ from 500 nm to 1500 nm were deposited on the 41/spl deg/ LiNbO/sub 3/ by RF diode sputtering from a glass target. An arrayed transducer pattern of aluminum interdigital transducer electrodes on the upper SiO/sub 2/ film surface facilitated the excitation of a wide frequency band of harmonic waves and permitted delineation of SAW velocity and propagation loss characteristics for several values of film-thickness to acoustic-wavelength (t//spl lambda/) ratio. With resonator patterns at the substrate/film interface, the capacitance ratio (C/sub m//C/sub 0/), related to coupling factor, and the temperature coefficient of frequency (TCF) were determined.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1996 IEEE International Frequency Control Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1996.559846","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
The surface acoustic wave (SAW) propagation properties of 41/spl deg/ Y-X lithium niobate (LiNbO/sub 3/) with SiO/sub 2/ film layers have been investigated using interdigital transducer structures. Different thicknesses of SiO/sub 2/ from 500 nm to 1500 nm were deposited on the 41/spl deg/ LiNbO/sub 3/ by RF diode sputtering from a glass target. An arrayed transducer pattern of aluminum interdigital transducer electrodes on the upper SiO/sub 2/ film surface facilitated the excitation of a wide frequency band of harmonic waves and permitted delineation of SAW velocity and propagation loss characteristics for several values of film-thickness to acoustic-wavelength (t//spl lambda/) ratio. With resonator patterns at the substrate/film interface, the capacitance ratio (C/sub m//C/sub 0/), related to coupling factor, and the temperature coefficient of frequency (TCF) were determined.