Simulated Fault Injection for Quantum Circuits Based on Simulator Commands

O. Boncalo, M. Udrescu, L. Prodan, M. Vladutiu, A. Amaricai
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引用次数: 2

Abstract

This paper addresses the problem of evaluating the fault tolerance algorithms and methodologies (FTAMS) designed for quantum circuits, by making use of fault injection techniques. These techniques are inspired from their rich classical counterparts, and were adapted to the quantum computation specific features, including the available error models. Because of their wide spectrum of application, including quantum circuit simulation, and their flexibility in circuit representation (i.e. both behavioral and structural descriptions of a circuit are possible), the hardware description languages (HDLs) appear as the best choice for our simulation experiments. The techniques employed for fault injection are based on simulator commands. The simulation results for the fault-affected circuit were compared to the outputs of a Gold circuit (a faultless circuit) in order to compute the quantum failure rate.
基于模拟器指令的量子电路故障注入仿真
本文讨论了利用故障注入技术评估量子电路容错算法和方法(FTAMS)的问题。这些技术受到了丰富的经典技术的启发,并适应了量子计算的特定特征,包括可用的误差模型。由于其广泛的应用范围,包括量子电路模拟,以及它们在电路表示方面的灵活性(即电路的行为和结构描述都是可能的),硬件描述语言(hdl)似乎是我们模拟实验的最佳选择。故障注入的技术是基于模拟器命令的。将故障影响电路的仿真结果与Gold电路(无故障电路)的输出进行比较,以计算量子故障率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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