{"title":"Fault Injection and Simulation for Fault Tolerant Reconfigurable Duplex System","authors":"P. Kubalík, J. Kvasnicka, H. Kubátová","doi":"10.1109/DDECS.2007.4295312","DOIUrl":null,"url":null,"abstract":"The implementation and the fault simulation technique for the highly reliable digital design using two FPGAs under a processor control is presented. Two FPGAs are used for duplex system design, each including the combination of totally self-checking blocks based on parity predictors to obtain better dependability parameters. Combinatorial circuit benchmarks have been considered in all our experiments and computations. A Totally Self-Checking analysis of duplex system is supported by experimental results from our proposed FPGA fault simulator, where SEU-fault resistance is observed. Our proposed hardware fault simulator is compared also with the software simulation. An area overhead of individual parts implemented in each FPGA is also discussed.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2007.4295312","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
The implementation and the fault simulation technique for the highly reliable digital design using two FPGAs under a processor control is presented. Two FPGAs are used for duplex system design, each including the combination of totally self-checking blocks based on parity predictors to obtain better dependability parameters. Combinatorial circuit benchmarks have been considered in all our experiments and computations. A Totally Self-Checking analysis of duplex system is supported by experimental results from our proposed FPGA fault simulator, where SEU-fault resistance is observed. Our proposed hardware fault simulator is compared also with the software simulation. An area overhead of individual parts implemented in each FPGA is also discussed.