S. Tezuka, T. Takeuchi, H. Sawai, M. Kurata, T. Kakehata, K. Ikeda, R. Motoyoshi, T. Hanada, E. Asano, T. Murakawa, S. Yamazaki
{"title":"Characteristics Variations and Reliability of CAAC-IGZO FETs","authors":"S. Tezuka, T. Takeuchi, H. Sawai, M. Kurata, T. Kakehata, K. Ikeda, R. Motoyoshi, T. Hanada, E. Asano, T. Murakawa, S. Yamazaki","doi":"10.7567/ssdm.2019.g-5-01","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":117226,"journal":{"name":"Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/ssdm.2019.g-5-01","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}