Perturber: semi-synthetic circuit generation using ancestor control for testing incremental place and route

D. Grant, G. Lemieux
{"title":"Perturber: semi-synthetic circuit generation using ancestor control for testing incremental place and route","authors":"D. Grant, G. Lemieux","doi":"10.1109/FPT.2006.270311","DOIUrl":null,"url":null,"abstract":"FPGA architects are always searching for more benchmark circuits to stress CAD tools and device architectures. In this paper we present a new heuristic to generate benchmark circuits specifically for incremental place and route tools. The method removes part of a real circuit and replaces it with a modified version of the same circuit to mimic an incremental design change. The generation procedure exactly preserves key circuit characteristics and achieves a post-routing channel width, critical path, and wire length that closely approximates those of the original circuit. Additionally, the method is fast and thus is suitable for use in on-the-fly benchmark generation","PeriodicalId":354940,"journal":{"name":"2006 IEEE International Conference on Field Programmable Technology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Conference on Field Programmable Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPT.2006.270311","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

FPGA architects are always searching for more benchmark circuits to stress CAD tools and device architectures. In this paper we present a new heuristic to generate benchmark circuits specifically for incremental place and route tools. The method removes part of a real circuit and replaces it with a modified version of the same circuit to mimic an incremental design change. The generation procedure exactly preserves key circuit characteristics and achieves a post-routing channel width, critical path, and wire length that closely approximates those of the original circuit. Additionally, the method is fast and thus is suitable for use in on-the-fly benchmark generation
摄动器:半合成电路生成使用祖先控制测试增量位置和路线
FPGA架构师一直在寻找更多的基准电路来强调CAD工具和器件架构。在本文中,我们提出了一种新的启发式方法来生成专门用于增量位置和路由工具的基准电路。该方法移除实际电路的一部分,并用修改后的相同电路替换它,以模拟增量设计更改。生成过程精确地保留了关键电路特性,并实现了与原始电路非常接近的路由后通道宽度、关键路径和导线长度。此外,该方法速度快,因此适合用于动态基准生成
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