{"title":"Perturber: semi-synthetic circuit generation using ancestor control for testing incremental place and route","authors":"D. Grant, G. Lemieux","doi":"10.1109/FPT.2006.270311","DOIUrl":null,"url":null,"abstract":"FPGA architects are always searching for more benchmark circuits to stress CAD tools and device architectures. In this paper we present a new heuristic to generate benchmark circuits specifically for incremental place and route tools. The method removes part of a real circuit and replaces it with a modified version of the same circuit to mimic an incremental design change. The generation procedure exactly preserves key circuit characteristics and achieves a post-routing channel width, critical path, and wire length that closely approximates those of the original circuit. Additionally, the method is fast and thus is suitable for use in on-the-fly benchmark generation","PeriodicalId":354940,"journal":{"name":"2006 IEEE International Conference on Field Programmable Technology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Conference on Field Programmable Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPT.2006.270311","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
FPGA architects are always searching for more benchmark circuits to stress CAD tools and device architectures. In this paper we present a new heuristic to generate benchmark circuits specifically for incremental place and route tools. The method removes part of a real circuit and replaces it with a modified version of the same circuit to mimic an incremental design change. The generation procedure exactly preserves key circuit characteristics and achieves a post-routing channel width, critical path, and wire length that closely approximates those of the original circuit. Additionally, the method is fast and thus is suitable for use in on-the-fly benchmark generation