A. K. Agarwa, S. Ryu, J. Richmond, C. Capell, J. Palmour, S. Balachandran, T. Chow, B. Geif, S. Bayne, C. Scozzie, K. Jones
{"title":"Recent progress in SiC bipolar junction transistors","authors":"A. K. Agarwa, S. Ryu, J. Richmond, C. Capell, J. Palmour, S. Balachandran, T. Chow, B. Geif, S. Bayne, C. Scozzie, K. Jones","doi":"10.1109/WCT.2004.240154","DOIUrl":null,"url":null,"abstract":"Bipolar junction transistors (BJT) and integrated Darlington pairs have been developed in 4H-SiC. The 3 mm x 3 mm BJTs show an on-state current of 20 A at a forward drop of 1.2 V at room temperature. The smaller 2 mm x 2 mm devices were tested up to 325 /spl deg/C. The on-resistance increases and the current gain reduces with increasing temperature. The reverse leakage current was measured to be less than 40 muA at 1000 V and 325 /spl deg/C. Inductive switching at 1000 V, 5 A shows extremely fast turn-on and turn-off behavior.","PeriodicalId":303825,"journal":{"name":"2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCT.2004.240154","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23
Abstract
Bipolar junction transistors (BJT) and integrated Darlington pairs have been developed in 4H-SiC. The 3 mm x 3 mm BJTs show an on-state current of 20 A at a forward drop of 1.2 V at room temperature. The smaller 2 mm x 2 mm devices were tested up to 325 /spl deg/C. The on-resistance increases and the current gain reduces with increasing temperature. The reverse leakage current was measured to be less than 40 muA at 1000 V and 325 /spl deg/C. Inductive switching at 1000 V, 5 A shows extremely fast turn-on and turn-off behavior.