Optimal design of 6T SRAM bitcells for ultra low-voltage operation

Amgad A. Ghonem, Mostafa F. Farid, M. Dessouky
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引用次数: 4

Abstract

Embedded SRAM is involved in many low-energy applications, e.g. stand-alone wireless sensor nodes. SRAMs have the highest energy contribution in such applications. Energy consumption can be decreased by lowering the supply voltage. However, SRAM bitcells impose a lower bound on the supply voltage. In this paper, ultra low-voltage SRAM design optimization is investigated in a 65nm technology. It is shown that the bitcell design at low-voltages is fairly different than that at nominal ones. Using aggressive write/read-assist techniques, the well-known 6-transistor bitcell can operate down to 0.5V. Five different optimized design options are compared. Write-optimized bitcells are shown to be optimal for ultra low-voltage operation.
超低压运行6T SRAM位元的优化设计
嵌入式SRAM涉及许多低能耗应用,例如独立无线传感器节点。sram在此类应用中具有最高的能量贡献。通过降低电源电压可以降低能耗。然而,SRAM位单元对电源电压施加了一个下限。本文研究了65nm工艺下的超低电压SRAM设计优化。结果表明,低电压下的位单元设计与标称电压下的位单元设计有很大的不同。采用积极的写/读辅助技术,众所周知的6晶体管位单元可以工作在0.5V以下。比较了五种不同的优化设计方案。写优化的位单元被证明是超低电压操作的最佳选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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