Optimum specification limit coefficient setting based on the smaller-the-better quality characteristics

Chung-Ho Chen, C. Chou
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Abstract

Abstract In this work, the authors propose the application of type I continuous sampling plan (CSP-1 plan) with expected inspection cost, expected replacement cost, expected warranty cost, expected quality loss for conforming product, and expected quality loss for nonconforming product per item. The quality characteristics of product is considered as the normal distribution with smaller-the-better characteristics. The quality loss function of product addresses the quadratic quality loss function. The CSP-1 plan is applied in the process control. The optimal combination of parameters is obtained from the minimum expected total cost per item produced under the specified average outgoing quality limit (AOQL) protection. One needs to have the optimal clearance number, sampling frequency, and specification limit coefficient.
基于越小越好质量特性的最佳规格极限系数设定
本文提出了一类连续抽样计划(CSP-1计划)的应用,该计划包含了每项预期检验成本、预期更换成本、预期保修成本、预期合格品质量损失和预期不合格品质量损失。认为产品的质量特征为正态分布,其特征越小越好。产品的质量损失函数解决了二次质量损失函数。过程控制采用CSP-1方案。在规定的平均出厂质量限制(AOQL)保护下,从每件产品的最小期望总成本中获得参数的最佳组合。需要有最佳的间隙数、采样频率和规格极限系数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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