H. Schmit, Thomas Kroll, M. Khusid, I. Kourtev, N. Vijaykrishnan, D. Landis
{"title":"The sandbox design experience course","authors":"H. Schmit, Thomas Kroll, M. Khusid, I. Kourtev, N. Vijaykrishnan, D. Landis","doi":"10.1109/MSE.2003.1205245","DOIUrl":null,"url":null,"abstract":"This paper deals with the Sandbox design experience course which was conceived to provide students with an ambitious team project experience in the context of modern ASIC design. The goal of the course is to design and verify a decoder for low-density parity check (LDPC) code using the latest commercial EDA tools in an industrial 0.16 micron process technology.","PeriodicalId":137611,"journal":{"name":"Proceedings 2003 IEEE International Conference on Microelectronic Systems Education. MSE'03","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2003 IEEE International Conference on Microelectronic Systems Education. MSE'03","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MSE.2003.1205245","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper deals with the Sandbox design experience course which was conceived to provide students with an ambitious team project experience in the context of modern ASIC design. The goal of the course is to design and verify a decoder for low-density parity check (LDPC) code using the latest commercial EDA tools in an industrial 0.16 micron process technology.