A 0.65ns, 72kb Ecl-cmos Ram Macro For A 1mb Sram

H. Nambu, K. Kanetani, Y. Idei, T. Masuda, K. Higeta, M. Ohayashi, M. Usami, K. Yamaguchi, T. Kikuchi, T. Ikeda, K. Ohhata, T. Kusunoki, N. Homma
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引用次数: 6

Abstract

An ultrahigh-speed 72-kb ECL-CMOS RAM macro for a 1-Mb SRAM with 0.65-ns address-access time, 0.80-ns write-pulse width, and 30.24-μm 2 memory cells has been developed using 0.3-μm BiCMOS technology. Two key techniques for achieving ultrahigh speed are an ECL decoder/driver circuit with a BiCMOS inverter and a write-pulse generator with a replica memory cell. These circuit techniques can reduce access time and write-pulse width of the 72-kb RAM macro to 71 % and 58 % of those of RAM macros with conventional circuits. In order to reduce crosstalk noise for CMOS memory-cell arrays driven at extremely high speeds, a twisted bit-line structure with a normally on MOS equalizer is proposed. These techniques are especially useful for realizing ultrahigh-speed, high-density SRAM's, witch have been used as cache and control storages in mainframe computers
用于1mb Sram的0.65ns, 72kb Ecl-cmos Ram宏
采用0.3 μm BiCMOS技术,开发了一个超高速72 kb ECL-CMOS RAM宏,用于1 mb SRAM,具有0.65 ns地址访问时间,0.80 ns写入脉冲宽度和30.24 μm 2存储单元。实现超高速的两个关键技术是带BiCMOS逆变器的ECL解码器/驱动电路和带复制存储单元的写脉冲发生器。这些电路技术可以将72kb RAM宏的访问时间和写脉冲宽度分别减少到传统电路的71%和58%。为了降低高速驱动的CMOS存储单元阵列的串扰噪声,提出了一种带常通MOS均衡器的扭曲位线结构。这些技术对于实现超高速、高密度的SRAM特别有用,它已被用作大型计算机的缓存和控制存储
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