{"title":"Complex relative permittivity measurement of ceramics by Fabry-Perot resonator in millimeter frequency range","authors":"Y. Itoh, Y. Higashida","doi":"10.1109/EDMO.1999.821485","DOIUrl":null,"url":null,"abstract":"Several techniques for measuring accurately the complex permittivity of ceramics using a Fabry-Perot resonator have been developed in millimeter frequency range. Accurate measurement became possible at 40-60 GHz by the three new techniques: 1. exact centering of the sample; 2. exact determination of the sample normal direction parallel to the resonator axis using a laser beam; 3. reduction of the higher-order spurious modes. The relative permittivity, /spl epsi/, and dielectric loss tangent, tan /spl delta/, were measured for commercially available silica substrates. It was found that the value of /spl epsi/ was 3.80, independent of frequency, which is consistent with the general feature of fine ceramics with high purity. The measurement error of /spl epsi/ was /spl plusmn/0.5%.","PeriodicalId":114744,"journal":{"name":"1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDMO.1999.821485","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Several techniques for measuring accurately the complex permittivity of ceramics using a Fabry-Perot resonator have been developed in millimeter frequency range. Accurate measurement became possible at 40-60 GHz by the three new techniques: 1. exact centering of the sample; 2. exact determination of the sample normal direction parallel to the resonator axis using a laser beam; 3. reduction of the higher-order spurious modes. The relative permittivity, /spl epsi/, and dielectric loss tangent, tan /spl delta/, were measured for commercially available silica substrates. It was found that the value of /spl epsi/ was 3.80, independent of frequency, which is consistent with the general feature of fine ceramics with high purity. The measurement error of /spl epsi/ was /spl plusmn/0.5%.