Fault detection in DCVS circuits

Abstract

Dynamic CMOS circuits are known to be easier to test, in general, than static CMOS circuits. Differential cascode voltage switch (DCVS) logic belongs to the dynamic CMOS logic family. No comprehensive results on deterministic testing of DCVS circuits have been presented previously. This paper discusses the detection of stuck-open, stuck-on and stuck-at faults in these circuits. A test set which detects all single stuck-on faults in the functional sections of the DCVS gates in the circuit can also be guaranteed to detect all multiple stuck-on, multiple stuck-open and unidirectional stuck-at faults in these sections, even when the faults are not confined to the functional section of a single gate. All detectable faults in the precharge, access and buffer transistors are also detected by the test set.<>