Circuit techniques for standby mode/Iddq test compatible voltage comparators

Abstract

This paper describes the means for IDDQ (quiescent supply current) testing of digital and mixed signal systems that contain analog circuits. A simple comparator design is presented that has been modified to be IDDQ test compatible. A by product of IDDQ test compatibility is a standby state that allows for a significant reduction in the IDDQ of the circuit, and an output data retention capability.