J.D. Saussine, D. Hamonic, E. Feuilloley, O. Feuillatre
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引用次数: 1
Abstract
This paper presents total dose test results of Components Off The Shelf (COTS), greater than 100 kGy(Si), for nuclear industry applications. Tested components are bipolar analog integrated circuits (operational amplifiers, regulators) and bipolar logic integrated circuits (TTL-LS and ECL technologies).