M. O’Bryan, K. Label, Raymond L. Ladbury, C. Poivey, J. W. Howard, Robert A. Reed, S. Kniffin, S. Buchner, J. Bings, Jeffrey Titus, Steven D. Clark, Thomas L. Turflinger, C. Seidleck, Cheryl J. Marshall, P. Marshall, Hak S. Kim, D. Hawkins, M. Carts, J. Forney, Michael R. Jones, A. Sanders, T. Irwin, S. R. Cox, Z. Kahric, Christopher D. Palor, J. A. Sciarini
{"title":"Current single event effects and radiation damage results for candidate spacecraft electronics","authors":"M. O’Bryan, K. Label, Raymond L. Ladbury, C. Poivey, J. W. Howard, Robert A. Reed, S. Kniffin, S. Buchner, J. Bings, Jeffrey Titus, Steven D. Clark, Thomas L. Turflinger, C. Seidleck, Cheryl J. Marshall, P. Marshall, Hak S. Kim, D. Hawkins, M. Carts, J. Forney, Michael R. Jones, A. Sanders, T. Irwin, S. R. Cox, Z. Kahric, Christopher D. Palor, J. A. Sciarini","doi":"10.1109/REDW.2002.1045537","DOIUrl":null,"url":null,"abstract":"We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.","PeriodicalId":135340,"journal":{"name":"IEEE Radiation Effects Data Workshop","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"50","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2002.1045537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 50
Abstract
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, proton-induced damage, and total ionizing dose. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, analog-to-digital converters (ADCs), digital-to-analog converters (DACs), and DC-DC converters, among others.
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