Built-in self-testing based on compressed 2-dimensional signature analysis

Abstract

The design of modern electronic systems demands high system reliability and maintainability. In order to perform fault detection, localization and isolation effectively, it is necessary to design a built-in self-testing (BIST) module specific to the corresponding system. This paper presents a BIST method based. on compressed 2-dimensional signature analysis. The principle of compression and performance of test are discussed in detail. Using the presented method, a high faulty coverage ratio (FCR) can be achieved with a short signature compressed in both time domain and space domain. Theoretical analysis shows that this method is reliable and it can be easily implemented in hardware.