Aging-aware logic synthesis

Mojtaba Ebrahimi, Fabian Oboril, S. Kiamehr, M. Tahoori
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引用次数: 58

Abstract

As CMOS technology scales down into the nanometer regime, designers have to add pessimistic timing margins to the circuit as guardbands to avoid timing violations due to various reliability effects, in particular accelerated transistor aging. Since aging is workload-dependent, the aging rates of different paths are non-uniform, and hence, design time delay-balanced circuits become significantly unbalanced after some operational time. In this paper, an aging-aware logic synthesis approach is proposed to increase circuit lifetime with respect to a specific guardband. Our main objective is to optimize the design timing with respect to post-aging delay in a way that all paths reach the assigned guardband at the same time. In this regard, in an iterative process, after computing the post-aging delays, the lifetime is improved by putting tighter timing constraints on paths with higher aging rate and looser constraints on paths which have less post-aging delay than the desired guarband. The experimental results shows that the proposed approach improves circuit lifetime in average by more than 3X with negligible impact on area. Our approach is implemented on top of a commercial synthesis toolchain, and hence scales very well.
感知老化的逻辑综合
随着CMOS技术缩小到纳米级,设计人员必须在电路中添加悲观的时序余量作为保护带,以避免由于各种可靠性影响而导致的时序违规,特别是晶体管加速老化。由于老化与工作负载有关,不同路径的老化速率是不均匀的,因此,设计时间延迟平衡电路在运行一段时间后会出现明显的不平衡。在本文中,提出了一种老化感知逻辑综合方法,以提高电路寿命相对于一个特定的保护带。我们的主要目标是优化设计时间,考虑后老化延迟,使所有路径同时到达指定的保护带。因此,在迭代过程中,在计算后老化延迟后,通过对老化率较高的路径施加更严格的时间约束,对后老化延迟小于期望保护带的路径施加更宽松的时间约束来提高寿命。实验结果表明,该方法平均将电路寿命提高了3倍以上,对面积的影响可以忽略不计。我们的方法是在商业合成工具链之上实现的,因此可扩展性非常好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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