Bits, Flips and RISCs

Nicolas Gerlin, Endri Kaja, F. Vargas, Li Lu, A. Breitenreiter, Junchao Chen, Markus Ulbricht, Maribel Gomez, Ares Tahiraga, S. Prebeck, E. Jentzsch, M. Krstic, W. Ecker
{"title":"Bits, Flips and RISCs","authors":"Nicolas Gerlin, Endri Kaja, F. Vargas, Li Lu, A. Breitenreiter, Junchao Chen, Markus Ulbricht, Maribel Gomez, Ares Tahiraga, S. Prebeck, E. Jentzsch, M. Krstic, W. Ecker","doi":"10.1109/DDECS57882.2023.10139331","DOIUrl":null,"url":null,"abstract":"Electronic systems can be submitted to hostile environments leading to bit-flips or stuck-at faults and, ultimately, a system malfunction or failure. In safety-critical applications, the risks of such events should be managed to prevent injuries or material damage. This paper provides a comprehensive overview of the challenges associated with designing and verifying safe and reliable systems, as well as the potential of the RISC-V architecture in addressing these challenges.We present several state-of-the-art safety and reliability verification techniques in the design phase. These include a highly-automated verification flow, an automated fault injection and analysis tool, and an AI-based fault verification flow. Furthermore, we discuss core hardening and fault mitigation strategies at the design level. We focus on automated SoC hardening using model-driven development and resilient processing based on sensing and prediction for space and avionic applications.By combining these techniques with the inherent flexibility of the RISC-V architecture, designers can develop tailored solutions that balance cost, performance, and fault tolerance to meet the requirements of various safety-critical applications in different safety domains, such as avionics, automotive, and space. The insights and methodologies presented in this paper contribute to the ongoing efforts to improve the dependability of computing systems in safety-critical environments.","PeriodicalId":220690,"journal":{"name":"2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS57882.2023.10139331","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Electronic systems can be submitted to hostile environments leading to bit-flips or stuck-at faults and, ultimately, a system malfunction or failure. In safety-critical applications, the risks of such events should be managed to prevent injuries or material damage. This paper provides a comprehensive overview of the challenges associated with designing and verifying safe and reliable systems, as well as the potential of the RISC-V architecture in addressing these challenges.We present several state-of-the-art safety and reliability verification techniques in the design phase. These include a highly-automated verification flow, an automated fault injection and analysis tool, and an AI-based fault verification flow. Furthermore, we discuss core hardening and fault mitigation strategies at the design level. We focus on automated SoC hardening using model-driven development and resilient processing based on sensing and prediction for space and avionic applications.By combining these techniques with the inherent flexibility of the RISC-V architecture, designers can develop tailored solutions that balance cost, performance, and fault tolerance to meet the requirements of various safety-critical applications in different safety domains, such as avionics, automotive, and space. The insights and methodologies presented in this paper contribute to the ongoing efforts to improve the dependability of computing systems in safety-critical environments.
位,翻转和risc
电子系统可能被置于恶劣的环境中,导致比特翻转或卡在故障上,最终导致系统故障或失效。在安全关键应用中,应管理此类事件的风险,以防止伤害或物质损坏。本文全面概述了与设计和验证安全可靠的系统相关的挑战,以及RISC-V架构在应对这些挑战方面的潜力。我们在设计阶段提出了几种最先进的安全性和可靠性验证技术。其中包括高度自动化的验证流、自动化的故障注入和分析工具,以及基于人工智能的故障验证流。此外,我们还讨论了设计级别的核心强化和故障缓解策略。我们专注于使用基于空间和航空电子应用的感知和预测的模型驱动开发和弹性处理的自动化SoC强化。通过将这些技术与RISC-V架构固有的灵活性相结合,设计人员可以开发出量身定制的解决方案,平衡成本、性能和容错性,以满足不同安全领域(如航空电子、汽车和空间)的各种安全关键应用要求。本文中提出的见解和方法有助于不断努力提高安全关键环境中计算系统的可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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