{"title":"The Impact of Bubble Defects on Performance and Reliability","authors":"W.J. Hsieh, C. H. Hsin, H. Chi, T.T. Chen","doi":"10.1109/IRPS.1980.362916","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":270567,"journal":{"name":"18th International Reliability Physics Symposium","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1980-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"18th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1980.362916","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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