{"title":"Characterization of Fast, Accurate Leakage Power Models for IEEE P2416","authors":"Barkha Gupta, W. R. Davis","doi":"10.1109/ISQED.2019.8697565","DOIUrl":null,"url":null,"abstract":"Recent results in power modeling for the emerging IEEE Standard Association project P2416 are presented. The standard promises to bring accurate power-modeling capability to system-level digital design tools. This paper presents the leakage power-model characterization approach in detail in the context of a simple four-gate circuit. Simulation results with a commercial 45nm technology over a range of temperatures and supply voltages show agreement with SPICE to within 1.8% on average and 16.6% in the worst case with a speedup of over 15,000X.","PeriodicalId":128327,"journal":{"name":"20th International Symposium on Quality Electronic Design (ISQED)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"20th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2019.8697565","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Recent results in power modeling for the emerging IEEE Standard Association project P2416 are presented. The standard promises to bring accurate power-modeling capability to system-level digital design tools. This paper presents the leakage power-model characterization approach in detail in the context of a simple four-gate circuit. Simulation results with a commercial 45nm technology over a range of temperatures and supply voltages show agreement with SPICE to within 1.8% on average and 16.6% in the worst case with a speedup of over 15,000X.