Concurrent error detection in linear analog circuits using state estimation

H. Stratigopoulos, Y. Makris
{"title":"Concurrent error detection in linear analog circuits using state estimation","authors":"H. Stratigopoulos, Y. Makris","doi":"10.1109/TEST.2003.1271105","DOIUrl":null,"url":null,"abstract":"We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in general, much smaller than a duplicate of the circuit under test. The error detection circuit monitors the input and some j u diciously selected observable internal nodes of the examined circuit to produce an estimate of its output. In error-free operation, this estimate converges to the actual output value in a time interval that can be controlled to be suficiently small. From then onwards, it follows exactly the output. The estimate is constructed such that it does not converge in the presence of errors and, thus, concurrent error detection is pegomzed by comparing the two signals through an analog checkel: The derived theory is validated through representative simulations on two filter examples.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271105","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in general, much smaller than a duplicate of the circuit under test. The error detection circuit monitors the input and some j u diciously selected observable internal nodes of the examined circuit to produce an estimate of its output. In error-free operation, this estimate converges to the actual output value in a time interval that can be controlled to be suficiently small. From then onwards, it follows exactly the output. The estimate is constructed such that it does not converge in the presence of errors and, thus, concurrent error detection is pegomzed by comparing the two signals through an analog checkel: The derived theory is validated through representative simulations on two filter examples.
基于状态估计的线性模拟电路并发误差检测
我们提出了一种在线性模拟电路中并发错误检测的新方法。我们开发了一个严格的理论,产生一个大小的错误检测电路,一般来说,比被测电路的复制品小得多。错误检测电路监视输入和被检测电路中任意选择的可观察的内部节点,以产生对其输出的估计。在无错误操作中,这个估计值在一个可以控制到足够小的时间间隔内收敛到实际输出值。从那时起,它完全跟随输出。该估计的构造使得它在存在错误时不会收敛,因此,通过模拟检查比较两个信号来进行并发错误检测:推导的理论通过两个滤波器示例的代表性仿真得到验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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