Improved Techniques and Instrumentation for EMC Measurements

M. Crawford
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引用次数: 2

Abstract

This paper presents a survey of improved measurement techniques, instrumentation, and data presentation for accurate, meaningful evaluation of electromagnetic compatibility (EMC) of electronic systems and sub­ systems. These techniques and instrumentation were developed as alternatives to conventional, MIL-STD461/462, measurements which recommend screen room testing with conventional antennas. These alterna­ tives are used to accurately measure and quantify EM emissions from electronic equipment and/or for estab­ lishing standardized EM susceptibility test fields. Dramatic improvement (worst case errors of 1 to 3 dB compared with 40 dB from conventional screen room measurements) have been demonstrated. The techniques described in the paper include: 1) low-Q or under­ ground enclosures, 2) mode stirred, shielded enclo­ sures, 3) specially designed, shielded, transverse electromagnetic (TEM) cells, 4) broadband field probes capable of measuring complex average or peak fields without causing perturbation, and 5) time and ampli­ tude statistics for characterizing the measured data.
改进的电磁兼容测量技术和仪器
本文综述了为准确、有意义地评估电子系统和子系统的电磁兼容性(EMC)而改进的测量技术、仪器和数据表示。这些技术和仪器是作为传统MIL-STD461/462的替代方案而开发的,MIL-STD461/462建议使用传统天线进行屏幕室测试。这些替代方案用于精确测量和量化电子设备的电磁辐射和/或建立标准化的电磁敏感性试验场。已经证明了显著的改进(与传统屏幕室测量的40 dB相比,最坏情况下误差为1到3 dB)。本文描述的技术包括:1)低q或地下外壳,2)模式搅拌屏蔽外壳,3)专门设计的屏蔽横向电磁(TEM)单元,4)能够测量复杂平均或峰值场而不会引起扰动的宽带场探头,以及5)用于表征测量数据的时间和幅度统计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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