Influence of arsenic isoelectronic Co-doping on the electronic properties of n-and p-type GaN

L. Guido, B. Dickerson, W. Houck, D. T. Gray
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Abstract

GaN samples were synthesized by OMVPE using TMGa, NH/sub 3/, AsH/sub 3/, SiH/sub 4/ and Cp/sub 2/Mg as precursors, and H/sub 2/ as the carrier gas. Direct comparisons between n-and p-type GaN samples with and without arsenic demonstrate that isoelectronic co-doping yields significant improvements in electronic properties. The surface morphology of both n-and p-type GaN improves considerably with the addition of AsH/sub 3/ into the OMVPE environment.
砷等电子共掺杂对n型和p型GaN电子性能的影响
以TMGa、nh3 /、AsH/ 3/、SiH/ sub4 /和Cp/ sub2 /Mg为前驱体,H/ sub2 /为载气,采用OMVPE法制备了GaN样品。直接比较含砷和不含砷的n型和p型GaN样品表明,等电子共掺杂可以显著改善电子性能。在OMVPE环境中添加AsH/sub - 3/后,n型和p型GaN的表面形貌都得到了显著改善。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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