Ultrafast Error Correction Codes for Double Error Detection/Correction

L. J. Saiz, P. Gil, J. Ruiz, J. Gracia, D. Gil, J. Baraza-Calvo
{"title":"Ultrafast Error Correction Codes for Double Error Detection/Correction","authors":"L. J. Saiz, P. Gil, J. Ruiz, J. Gracia, D. Gil, J. Baraza-Calvo","doi":"10.1109/EDCC.2016.28","DOIUrl":null,"url":null,"abstract":"Register protection against soft errors remains a major concern for deep sub-micron systems due to technology scaling. Error Correction Codes (ECCs) improve protection at the price of data redundancy. Reducing such redundancy is of upmost importance for memories, although it is less important in registers. A major requirement for register protection is to keep codes' encoding and decoding latencies as short as possible. Ultrafast Single Error Correction codes are an interesting option for this purpose. They allow very low encoding/decoding delays, but at the cost of a high redundancy. This paper proposes a new method to develop Ultrafast codes, adding new error coverages. Different Ultrafast codes have been designed, simulated and compared to other codes. Using Ultrafast codes, double error detection or, alternatively, double adjacent error correction can be achieved using 2-gate-delay encoding and 4-gate-delay decoding circuits. One of the major advantages of Ultrafast codes is that these delays do not depend on the register length.","PeriodicalId":166039,"journal":{"name":"2016 12th European Dependable Computing Conference (EDCC)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 12th European Dependable Computing Conference (EDCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDCC.2016.28","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Register protection against soft errors remains a major concern for deep sub-micron systems due to technology scaling. Error Correction Codes (ECCs) improve protection at the price of data redundancy. Reducing such redundancy is of upmost importance for memories, although it is less important in registers. A major requirement for register protection is to keep codes' encoding and decoding latencies as short as possible. Ultrafast Single Error Correction codes are an interesting option for this purpose. They allow very low encoding/decoding delays, but at the cost of a high redundancy. This paper proposes a new method to develop Ultrafast codes, adding new error coverages. Different Ultrafast codes have been designed, simulated and compared to other codes. Using Ultrafast codes, double error detection or, alternatively, double adjacent error correction can be achieved using 2-gate-delay encoding and 4-gate-delay decoding circuits. One of the major advantages of Ultrafast codes is that these delays do not depend on the register length.
用于双重错误检测/纠正的超快纠错码
由于技术的扩展,对软错误的寄存器保护仍然是深亚微米系统的主要关注点。纠错码(ecc)提高了保护,但代价是数据冗余。减少这种冗余对存储器来说是最重要的,尽管它在寄存器中不那么重要。寄存器保护的一个主要要求是保持代码的编码和解码延迟尽可能短。对于这个目的,超快单错误校正码是一个有趣的选择。它们允许非常低的编码/解码延迟,但代价是高冗余。本文提出了一种开发超快码的新方法,增加了新的错误覆盖率。对不同的超快码进行了设计、仿真,并与其他码进行了比较。使用超快编码,可以使用2门延迟编码和4门延迟解码电路实现双错误检测或双相邻纠错。超快码的主要优点之一是这些延迟不依赖于寄存器长度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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