{"title":"Impact of short-channel effects on velocity overshoot in MOSFET","authors":"G. Hiblot, Q. Rafhay, F. Boeuf, G. Ghibaudo","doi":"10.1109/NEWCAS.2015.7182061","DOIUrl":null,"url":null,"abstract":"In this work, the impact of short-channel effects on velocity overshoot is discussed. Hydrodynamic simulations are first performed to investigate the overshoot behavior under a uniform electric field. Then a spatially varying electric field, which corresponds to the electric field profile in a MOSFET in inversion, is introduced to observe the impact of short-channel effects on velocity overshoot. Finally, SPICE simulations of a ring-oscillator are used to analyze how the combined influence of overshoot and short-channel effects affect the performance of downscaled CMOS technology.","PeriodicalId":404655,"journal":{"name":"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEWCAS.2015.7182061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
In this work, the impact of short-channel effects on velocity overshoot is discussed. Hydrodynamic simulations are first performed to investigate the overshoot behavior under a uniform electric field. Then a spatially varying electric field, which corresponds to the electric field profile in a MOSFET in inversion, is introduced to observe the impact of short-channel effects on velocity overshoot. Finally, SPICE simulations of a ring-oscillator are used to analyze how the combined influence of overshoot and short-channel effects affect the performance of downscaled CMOS technology.