Space radiation and reliability qualifications on 65nm CMOS 600MHz microprocessors

S. Clerc, F. Abouzeid, G. Gasiot, J. Daveau, C. Bottoni, M. Glorieux, J. Autran, F. Cacho, V. Huard, L. Dugoujon, R. Weigand, F. Malou, L. Hili, P. Roche
{"title":"Space radiation and reliability qualifications on 65nm CMOS 600MHz microprocessors","authors":"S. Clerc, F. Abouzeid, G. Gasiot, J. Daveau, C. Bottoni, M. Glorieux, J. Autran, F. Cacho, V. Huard, L. Dugoujon, R. Weigand, F. Malou, L. Hili, P. Roche","doi":"10.1109/IRPS.2013.6532051","DOIUrl":null,"url":null,"abstract":"Recent space programs have reached the limits of the current space digital ASIC offers, mainly relying on CMOS 180nm. The new ST CMOS 65nm space program described in this paper shows how those limits are overcome. Small modifications to the commercial bulk process, paired with cost effective design reinforcements allow higher density and better energy efficiency while ensuring a strong space-grade resilience. The implementation of a 32-bit SPARC LEON3 microprocessor demonstrates the capabilities of this new technology.","PeriodicalId":138206,"journal":{"name":"2013 IEEE International Reliability Physics Symposium (IRPS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2013.6532051","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

Recent space programs have reached the limits of the current space digital ASIC offers, mainly relying on CMOS 180nm. The new ST CMOS 65nm space program described in this paper shows how those limits are overcome. Small modifications to the commercial bulk process, paired with cost effective design reinforcements allow higher density and better energy efficiency while ensuring a strong space-grade resilience. The implementation of a 32-bit SPARC LEON3 microprocessor demonstrates the capabilities of this new technology.
65nm CMOS 600MHz微处理器的空间辐射和可靠性鉴定
最近的空间项目已经达到了目前空间数字ASIC提供的极限,主要依靠CMOS 180nm。本文中描述的新ST CMOS 65nm空间计划显示了如何克服这些限制。对商业散装工艺的微小修改,加上具有成本效益的设计增强,可以实现更高的密度和更好的能源效率,同时确保强大的空间级弹性。32位SPARC LEON3微处理器的实现证明了这种新技术的能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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