On testing timing-speculative circuits

F. Yuan, Yannan Liu, W. Jone, Q. Xu
{"title":"On testing timing-speculative circuits","authors":"F. Yuan, Yannan Liu, W. Jone, Q. Xu","doi":"10.1145/2463209.2488771","DOIUrl":null,"url":null,"abstract":"By allowing the occurrence of infrequent timing errors and correcting them online, circuit-level timing speculation is one of the most promising variation-tolerant design techniques. How to effectively test timing-speculative circuits, however, has not been addressed in the literature. This is a challenging problem because conventional scan techniques cannot provide sufficient controllability and observability for such circuits. In this paper, we propose novel techniques to achieve high fault coverage for timing-speculative circuits without incurring high design-for-testability cost. Experimental results on various benchmark circuits demonstrate the effectiveness of the proposed solution.","PeriodicalId":320207,"journal":{"name":"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2463209.2488771","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

By allowing the occurrence of infrequent timing errors and correcting them online, circuit-level timing speculation is one of the most promising variation-tolerant design techniques. How to effectively test timing-speculative circuits, however, has not been addressed in the literature. This is a challenging problem because conventional scan techniques cannot provide sufficient controllability and observability for such circuits. In this paper, we propose novel techniques to achieve high fault coverage for timing-speculative circuits without incurring high design-for-testability cost. Experimental results on various benchmark circuits demonstrate the effectiveness of the proposed solution.
关于测试时序推测电路
通过允许发生罕见的定时错误并在线纠正它们,电路级定时推测是最有前途的容变设计技术之一。然而,如何有效地测试时序推测电路,在文献中尚未得到解决。这是一个具有挑战性的问题,因为传统的扫描技术不能为这种电路提供足够的可控性和可观察性。在本文中,我们提出了新的技术来实现高故障覆盖率的时间推测电路,而不会产生高的可测试性设计成本。在各种基准电路上的实验结果证明了该方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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