A 120 GS/s 2:1 Analog Multiplexer with High Linearity in SiGe-BiCMOS Technology

Michael Collisi, M. Möller
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引用次数: 11

Abstract

A 2:1 analog multiplexer (AMUX) in SiGe BiCMOS technology with a record sampling rate for SiGe-technology of 120 GS/s, is presented. The AMUX is intended to double the signal bandwidth of two 8-bit digital-to-analog-converters and achieves an effective resolution (ENoB) of 7.7 bit, at low frequencies as well as 5.1 bit at 48.8 GHz and 4.1 bit at 58.6 GHz for sampling rates of 100 GS/s and 120 GS/s, respectively. These are the highest resolutions reported for an AMUX in any kind of semiconductor technology. The results were obtained by a simple selector-circuit concept that was carefully optimized in the frequency domain with regard to balanced signal paths. The AMUX performance was demonstrated by measurements on an RF-module bondwire-assembly of the AMUX-chip.
基于SiGe-BiCMOS技术的高线性120 GS/s 2:1模拟多路复用器
提出了一种基于SiGe BiCMOS技术的2:1模拟多路复用器(AMUX),其采样率达到了SiGe技术的120 GS/s。AMUX旨在将两个8位数模转换器的信号带宽提高一倍,并在低频率下实现7.7位的有效分辨率(ENoB),以及在100gs /s和120gs /s的采样率下,在48.8 GHz和58.6 GHz分别实现5.1位和4.1位的有效分辨率。这是AMUX在任何半导体技术中报道的最高分辨率。结果是通过一个简单的选择电路概念,在频域上仔细地优化了平衡信号路径。通过对AMUX芯片的rf模块键合线组件的测量,证明了AMUX的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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