Electro-magnetic robustness of integrated circuits: from statement to prediction

S. Bendhia, A. Boyer
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引用次数: 5

Abstract

EMRIC project, a new research activity mixing integrated circuits electromagnetic compatibility (EMC) and integrated circuits (ICs) reliability, provides methods and guidelines to circuits and equipment designers to ensure EMC during lifetime of their applications. In order to improve the ICs electromagnetic robustness (EMR) this project studies the effect of ICs ageing on electromagnetic emission and immunity to radio frequency interferences, clarifies the link between IC degradations and related EMC drifts and develops prediction models and propose “time insensitive” EMC protection structures.
集成电路的电磁鲁棒性:从陈述到预测
EMRIC项目是一项将集成电路电磁兼容性(EMC)和集成电路(ic)可靠性相结合的新研究活动,为电路和设备设计人员提供方法和指南,以确保其应用生命周期内的EMC。为了提高集成电路的电磁鲁棒性(EMR),本项目研究了集成电路老化对电磁发射和抗射频干扰的影响,阐明了集成电路老化与相关电磁兼容漂移之间的联系,建立了预测模型,提出了“时间不敏感”的电磁兼容保护结构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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